As a Basic Contact Probe, F77230B130G150 (item number 1001572) establishes a spring-loaded electrical connection to the test point. With tip style 30 (Triangular 45°), F77230B130G150 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F77230B130G150 combines a pitch of 2.54 mm / 100 mil with tip style 30 (Triangular 45°) and a tip diameter of 1.3 mm. F77230B130G150 operates with 150 cN spring force and 4 mm nominal travel. F77230B130G150 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77230B130G150 is made of beryllium copper and is gold-plated.
