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F77230B130G150 Perspective 1 F77230B130G150 Perspective 2

Basic Contact Probes (100 mil) F77230B130G150

Item number 1001572

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F772
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Dimensions
Total length (mm) 32
Protrusion height (mm) 10
Tip style diameter (mm) 1.3
Barrel diameter (mm) 1.66
Collar diameter (mm) 2.04
Press ring diameter (mm) 2.04
Materials and surfaces
Tip style 30
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 60
Spring force (cN) 150
Nominal travel (mm) 4
Maximum travel (mm) 5
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 25

Graphics

F77230B130G150 Family designation F77230B130G150 Tip style 1

Beschreibung des Produkts

As a Basic Contact Probe, F77230B130G150 (item number 1001572) establishes a spring-loaded electrical connection to the test point. With tip style 30 (Triangular 45°), F77230B130G150 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F77230B130G150 combines a pitch of 2.54 mm / 100 mil with tip style 30 (Triangular 45°) and a tip diameter of 1.3 mm. F77230B130G150 operates with 150 cN spring force and 4 mm nominal travel. F77230B130G150 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77230B130G150 is made of beryllium copper and is gold-plated.