The Basic Contact Probe F58815B150G080S (item number 1170076) is designed for repeated contacting of test points in electronic test fixtures. With tip style 15 (Triangular 45° stepped), F58815B150G080S combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F58815B150G080S combines a pitch of 2.54 mm / 100 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 1.5 mm. Spring force is 80 cN at a nominal travel of 7.6 mm. The continuous-current rating of F58815B150G080S is 5 A.
