The Basic Contact Probe F10021S080L200 (item number 1172247) is designed for repeated contacting of test points in electronic test fixtures. With tip style 21 (4-point crown (self-cleaning)), F10021S080L200 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. The design combines a pitch of 2.54 mm / 100 mil with tip style 21 (4-point crown (self-cleaning)) and a tip diameter of 0.8 mm. For F10021S080L200, spring force is 200 cN at a nominal travel of 4.3 mm. For F10021S080L200, the specified continuous current is 5 A.
