The Basic Contact Probe F10011B064G100 (item number 1167704) is designed for repeated contacting of test points in electronic test fixtures. With tip style 11 (Spherical), F10011B064G100 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. F10011B064G100 combines a pitch of 2.54 mm / 100 mil with tip style 11 (Spherical) and a tip diameter of 0.64 mm. F10011B064G100 operates with 100 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F10011B064G100 is 5 A.