The Basic Contact Probe F10006B130G150ML (item number 1167699) is designed for repeated contacting of test points in electronic test fixtures. With tip style 06 (Serrated stepped), F10006B130G150ML combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F10006B130G150ML combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.3 mm. F10006B130G150ML operates with 150 cN spring force and 4.3 mm nominal travel. For F10006B130G150ML, the specified continuous current is 5 A.
