The Fine Pitch Double Plunger Probe FP510D0101S036L040L243H (item number 1013358) is designed for precise contacting where installation space is limited. Tip style 01 (Conical 90°) targets FP510D0101S036L040L243H at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP510D0101S036L040L243H, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.7 mm / 28 mil, spring force 40 cN, continuous current 1 A. The H suffix on FP510D0101S036L040L243H denotes the high-temperature variant, designed for applications up to 200 °C.
