The Basic Contact Probe F10006B130G200H (item number 1043598) is a spring-loaded probe for temporary electrical contact with test points. With tip style 06 (Serrated stepped), F10006B130G200H combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F10006B130G200H combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.3 mm. For F10006B130G200H, spring force is 200 cN at a nominal travel of 4.3 mm. F10006B130G200H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F10006B130G200H is made of beryllium copper and is gold-plated. In this H configuration, F10006B130G200H is part of the high-temperature range and can be used in applications up to 200 °C.