The Basic Contact Probe F10017B200G100 (item number 1041228) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10017B200G100 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10017B200G100 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. For F10017B200G100, spring force is 100 cN at a nominal travel of 4.3 mm. The electrical rating of F10017B200G100 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10017B200G100 is made of beryllium copper and is gold-plated.
