The Basic Contact Probe F10015B250G200 (item number 1014374) is a spring-loaded probe for temporary electrical contact with test points. With tip style 15 (Triangular 45° stepped), F10015B250G200 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F10015B250G200 combines a pitch of 2.54 mm / 100 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 2.5 mm. For F10015B250G200, spring force is 200 cN at a nominal travel of 4.3 mm. F10015B250G200 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10015B250G200 is made of beryllium copper and is gold-plated.
