The Basic Contact Probe F77207S175L150 (item number 1001628) is a spring-loaded probe for temporary electrical contact with test points. With tip style 07 (Hexagonal 90° stepped), F77207S175L150 combines ICT/FCT use with a geometry intended for plated vias and pads where sharp edges penetrate contamination and oxide layers. F77207S175L150 combines a pitch of 2.54 mm / 100 mil with tip style 07 (Hexagonal 90° stepped) and a tip diameter of 1.75 mm. F77207S175L150 operates with 150 cN spring force and 4 mm nominal travel. F77207S175L150 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77207S175L150 is made of steel and uses Longtime Gold plating.
