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F77233S130L200E15H Perspective 1 F77233S130L200E15H Perspective 2

F77233S130L200E15H

Item number 1169312

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F772
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Additional definition EXX
Dimensions
Total length (mm) 37
Protrusion height (mm) 15
Tip style diameter (mm) 1.3
Barrel diameter (mm) 1.66
Collar diameter (mm) 2.04
Press ring diameter (mm) 2.04
Materials and surfaces
Tip style 33
Plunger material Steel
Plunger plating Longtime Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 80
Spring force (cN) 200
Nominal travel (mm) 4
Maximum travel (mm) 5
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 25

Graphics

F77233S130L200E15H Family designation

Beschreibung des Produkts

The Basic Contact Probe F77233S130L200E15H (item number 1169312) is designed for repeated contacting of test points in electronic test fixtures. With tip style 33 (Square lance 38°), F77233S130L200E15H combines ICT/FCT use with a geometry intended for vias and solder pads where the edges can break through residues and oxide layers. F77233S130L200E15H combines a pitch of 2.54 mm / 100 mil with tip style 33 (Square lance 38°) and a tip diameter of 1.3 mm. For F77233S130L200E15H, spring force is 200 cN at a nominal travel of 4 mm. For F77233S130L200E15H, the specified continuous current is 5 A. The final H identifies the high-temperature version; F77233S130L200E15H is suitable for applications up to 200 °C.