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High Current Probes (Power electronics) HCF56612B400G500

Item number 1029497

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family HCF566
Pitch (mm/mil) 4,50 / 177
Temperature -45°C...+200°C
Dimensions
Total length (mm) 36.1
Protrusion height (mm) 8.9
Tip style diameter (mm) 4
Barrel diameter (mm) 3.18
Materials and surfaces
Tip style 12
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Uncoated
Mechanical specifications
Preload (cN) 300
Spring force (cN) 500
Nominal travel (mm) 4.3
Maximum travel (mm) 6.4
Pointing accuracy +/- (mm) 0.1
Electrical specifications
Continuous current (A) 40
Typical contact resistance (mOhm) 15

Graphics

HCF56612B400G500 Family designation HCF56612B400G500 Diagram HCF56612B400G500 Tip style 1

Beschreibung des Produkts

The High Current Probe HCF56612B400G500 (item number 1029497) is designed for safe transmission of high electrical currents in test and contacting applications. HCF56612B400G500 focuses on current capacity and low transition losses, as required in battery testing, formation and other e-mobility applications. For HCF56612B400G500, contact resistance, contact force and thermal behavior must be considered together because they influence voltage drop and temperature rise at the contact point. The intended application area for HCF56612B400G500 includes power-electronics testing. HCF56612B400G500 is rated for 40 A continuous current with a typical contact resistance of 15 mΩ. For HCF56612B400G500, spring force is 500 cN at a nominal travel of 4.3 mm.