The Basic Contact Probe F77221B130G300H (item number 1013037) is a spring-loaded probe for temporary electrical contact with test points. With tip style 21 (4-point crown (self-cleaning)), F77221B130G300H combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F77221B130G300H combines a pitch of 2.54 mm / 100 mil with tip style 21 (4-point crown (self-cleaning)) and a tip diameter of 1.3 mm. F77221B130G300H operates with 300 cN spring force and 4 mm nominal travel. The electrical rating of F77221B130G300H combines 5 A continuous current with 100 mΩ typical contact resistance. The plunger in F77221B130G300H is made of beryllium copper and is gold-plated. The final H identifies the high-temperature version; F77221B130G300H is suitable for applications up to 200 °C.
